Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Wavelet-based 2-D Statistical Process Control for Wafer Bin Maps
- Authors
- 배석주
- Issue Date
- 28-Nov-2019
- Publisher
- The Korean Society of Mechanical Engineers
- Citation
- 5th International Conference on Materials and Reliability
- Conference Name
- 5th International Conference on Materials and Reliability
- Place
- Jeju Island, Korea
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 공과대학 > 서울 산업공학과 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Bae, Suk Joo
- COLLEGE OF ENGINEERING (DEPARTMENT OF INDUSTRIAL ENGINEERING)