Detailed Information

Cited 2 time in webofscience Cited 3 time in scopus
Metadata Downloads

Robust LMedS-Based WLS and Tukey-Based EKF Algorithms Under LOS/NLOS Mixture Conditionsopen access

Authors
Park, Chee-HyunChang, Joon-Hyuk
Issue Date
Oct-2019
Publisher
Institute of Electrical and Electronics Engineers Inc.
Keywords
Localization; robust; least median of squares; spherical simplex unscented transform; weighted least squares; extended Kalman filter
Citation
IEEE Access, v.7, pp.148198 - 148207
Indexed
SCIE
SCOPUS
Journal Title
IEEE Access
Volume
7
Start Page
148198
End Page
148207
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/12427
DOI
10.1109/ACCESS.2019.2946376
ISSN
2169-3536
Abstract
In this paper, we present robust localization algorithms that use range measurements. The least median of squares (LMedS)-weighted least squares (WLS), LMedS-spherical simplex unscented transform (SSUT) based WLS and Tukey-based extended Kalman filter (EKF) algorithms are proposed for line-of-sight (LOS)/non-line-of-sight (NLOS) mixture environments. First, the LMedS solution is obtained, and then sensors are predicted to be LOS or LOS/NLOS mixture sensors. The range observation predicted as an outlier is replaced with the estimated distance obtained using the LMedS algorithm. Subsequently, the two-step WLS method is executed using these new distance measurements. In the Tukey-based EKF method, Tukey's risk function and the 3-sigma edit rule are employed in the innovation step. Furthermore, the mean square error (MSE) analysis of the proposed algorithms is performed. We demonstrate that the positioning accuracy of the proposed methods is higher than that of conventional methods through extensive simulation.
Files in This Item
Appears in
Collections
서울 공과대학 > 서울 융합전자공학부 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Chang, Joon-Hyuk photo

Chang, Joon-Hyuk
COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE