Reduction of Persistent Photoconduction with IGZO/ZnON-Tandem-Structure Visible-Near-Infrared Phototransistors
- Authors
- Lee, Hyun-Mo; Kim, Yoon-Seo; Rim, You Seung; Park, Jin-Seong
- Issue Date
- Apr-2021
- Publisher
- AMER CHEMICAL SOC
- Keywords
- indium-gallium-zinc oxide; zinc oxynitride; persistent photoconduction; photo thin-film transistor; near-infrared photosensor
- Citation
- ACS APPLIED MATERIALS & INTERFACES, v.13, no.15, pp.17827 - 17834
- Indexed
- SCIE
SCOPUS
- Journal Title
- ACS APPLIED MATERIALS & INTERFACES
- Volume
- 13
- Number
- 15
- Start Page
- 17827
- End Page
- 17834
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/1268
- DOI
- 10.1021/acsami.1c02593
- ISSN
- 1944-8244
- Abstract
- Indium-gallium-zinc oxide- and zinc oxynitride-based heterojunction phototransistors were successfully demonstrated to control the persistent photoconduction (PPC) effect and be also responded sensitively at the range from visible to near-infrared. ZnON plays a key role in extending the spectral response at various frequencies of operation. The devices show significantly different photoresponse and photorecovery characteristics depending on the number of stacked layers of IGZO and ZnON. After negative bias and illumination stress was applied to the devices for 1 h, tandem-structure-based phototransistors recovered remarkably better than single-component IGZO devices. We suggest that the improvements to photoresponse and photorecovery result from the presence of potential wells between two IGZO layers and the energy band alignment of the tandem structure.
- Files in This Item
-
Go to Link
- Appears in
Collections - 서울 공과대학 > 서울 신소재공학부 > 1. Journal Articles

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.