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Reduction of Persistent Photoconduction with IGZO/ZnON-Tandem-Structure Visible-Near-Infrared Phototransistors

Authors
Lee, Hyun-MoKim, Yoon-SeoRim, You SeungPark, Jin-Seong
Issue Date
Apr-2021
Publisher
AMER CHEMICAL SOC
Keywords
indium-gallium-zinc oxide; zinc oxynitride; persistent photoconduction; photo thin-film transistor; near-infrared photosensor
Citation
ACS APPLIED MATERIALS & INTERFACES, v.13, no.15, pp.17827 - 17834
Indexed
SCIE
SCOPUS
Journal Title
ACS APPLIED MATERIALS & INTERFACES
Volume
13
Number
15
Start Page
17827
End Page
17834
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/1268
DOI
10.1021/acsami.1c02593
ISSN
1944-8244
Abstract
Indium-gallium-zinc oxide- and zinc oxynitride-based heterojunction phototransistors were successfully demonstrated to control the persistent photoconduction (PPC) effect and be also responded sensitively at the range from visible to near-infrared. ZnON plays a key role in extending the spectral response at various frequencies of operation. The devices show significantly different photoresponse and photorecovery characteristics depending on the number of stacked layers of IGZO and ZnON. After negative bias and illumination stress was applied to the devices for 1 h, tandem-structure-based phototransistors recovered remarkably better than single-component IGZO devices. We suggest that the improvements to photoresponse and photorecovery result from the presence of potential wells between two IGZO layers and the energy band alignment of the tandem structure.
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