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A 320-MS/s 2-b/cycle Second-order Noise-shaping SAR ADC

Authors
Park, JaehyeongPark, Sang-Gyu
Issue Date
Dec-2021
Publisher
IEEK PUBLICATION CENTER
Keywords
Oversampling ADC; noise-shaping; multi-bit/cycle SAR
Citation
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.21, no.6, pp.472 - 482
Indexed
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
Volume
21
Number
6
Start Page
472
End Page
482
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/140049
DOI
10.5573/JSTS.2021.21.6.472
ISSN
1598-1657
Abstract
—A 2nd-order Noise-Shaping ADC using a 2-bit/cycle SAR ADC is proposed. With a designated reference DAC and a signal DAC, three comparators in the SAR ADC enable 2-bit conversion in each comparison cycle. The noise transfer function (NTF) of the ADC is implemented in an error-feedback structure to bypass the need for power-consuming integrator. A low-gain switched input/output open-loop residue amplifier and a switched-capacitor FIR filter realizes the NTF coefficients. The proposed ADC was designed with a 28-nm CMOS process with 1-V power supply. The SPICE simulation results show that the designed ADC has SNDR of 69.9 dB and power consumption of 4.08 mW, when operated with a sampling rate of 320-MS/s and OSR of 8 achieving a Walden figure-of-merit (FoM) of 39.9-fJ/conv.-step.
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Park, Sang Gyu
COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)
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