ScholarWorks@Hanyang University

JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE

Journal Title

  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE

ISSN

  • E 2233-4866 | P 1598-1657

Publisher

  • 대한전자공학회

Listed on(Coverage)

JCR 2011-2019
SJR 2006-2008;2010-2019
CiteScore 2011-2019
SCIE 2011-2021
CC 2016-2021
SCOPUS 2017-2020
KCI(Ranking) 2009-2019
KCI 2010-2021
KCI(Candidate) 2007-2009

Active

  • Active

    based on the information

    • SCOPUS:2020-10

Country

  • SOUTH KOREA

Article List

1 - 20 out of 29 results.

SCIESCOPUSKCI
Resistor-BJT-less PTAT Current Generator with Single Threshold MOSFETGo to Link

Uhm, Donghyun; Kim, Kwanwoo; Kim, Hojun; Park, Himchan; Yang, Jun-Hyeok; Lim, Jaemyung

ArticleIssue Date2026CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.26, no.1, pp 29 - 35PublisherIEEK PUBLICATION CENTER
SCIESCOPUSKCI
Hardware-software Co-design for Vector Similarity Search on HBM-PIMGo to Link

Kim, Nahyeon; Kim, Sujin; Jung, Min; Noh, Haechannuri; Kim, Ji-Hoon

ArticleIssue Date2025CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.25, no.6, pp 662 - 669PublisherIEEK PUBLICATION CENTER
SCIESCOPUSKCI
A 400-MS/s 2-b/cycle Second-order Noise-shaping SAR ADC Using FIA-based Ring AmplifierGo to Link

Kim, Jiwoo; Park, Sang Gyu

ArticleIssue Date2025CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.25, no.4, pp 441 - 450Publisher대한전자공학회
SCIESCOPUSKCI
Fault-tolerant GEMM Acceleratorbased on Microarchitectural Fault Analysis for Resource-constrained DevicesGo to Link

Park, Sunyoung; Yang, Hannah; Kim, Hana; Kim, Hyunji; Kim, Ji-Hoon

ArticleIssue Date2025CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.25, no.3, pp 318 - 324Publisher대한전자공학회
SCIESCOPUSKCI
Thermal Analysis of Indirect Double-sided Cooling Power Modules Considering the Impact of ThermalInterface Material CharacteristicsGo to Link

So, Ji Yong; Yoon, Young Doo; Yoon, Sang Won

ArticleIssue Date2025CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.25, no.2, pp 148 - 153Publisher대한전자공학회
SCIESCOPUSKCI
A 24-Gb/s PAM-4 Tailless Current-mode Driver with Output Impedance Enhancing Technique in 14-nm FinFETGo to Link

Jo, Yunseong; Han, Jaeduk

ArticleIssue Date2024CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.24, no.6, pp 540 - 546Publisher대한전자공학회
SCIESCOPUSKCI
A 2-GS/s 6-bit Single-channel Speculative Loop-unrolled SAR ADC with Low-overhead Comparator Offset Calibration in 28-nm CMOSGo to Link

Lee, Eunsang; Lee, Sanghun; Pyo, Changhyun; Kim, Hyunseok; Han, Jaeduk

ArticleIssue Date2024CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.24, no.4, pp 355 - 364Publisher대한전자공학회
SCIESCOPUSKCI
A Third-order Noise-shaping SAR ADC using PVT-insensitive Voltage-time-voltage Converter and Mismatch-ShapingGo to Link

Park, Sung-Hyun; Park, Sang-Gyu

ArticleIssue Date2024CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.24, no.4, pp 332 - 342Publisher대한전자공학회
SCIESCOPUSKCI
Annealing Effects on Charge Trap Flash with TAHOS StructureGo to Link

Song, Min Suk; Hwang, Hwiho; Yu, Junsu; Hwang, Sungmin; Kim, Hyungjin

ArticleIssue Date2024CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.24, no.4, pp 323 - 331Publisher대한전자공학회
SCIESCOPUSKCI
A Simple Timing-skew Calibration using Flip-flops for Time-interleaved ADCsGo to Link

Lim, Ji-Hun; Park, Sang-Gyu

ArticleIssue Date2023CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.23, no.2, pp.89 - 97PublisherIEEK PUBLICATION CENTER
SCIESCOPUSKCI
A 320-MS/s 2-b/cycle Second-order Noise-shaping SAR ADCGo to Link

Park, Jaehyeong; Park, Sang-Gyu

ArticleIssue Date2021CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.21, no.6, pp 472 - 482Publisher대한전자공학회
SCIESCOPUSKCI
Alternate Pulse Scheme in a Hardware Neural Network for Reducing the Influence of Asymmetry on Synaptic Weight UpdatingGo to Link

Li, Cheng; An, Junseop; Kweon, Jun Young; Song, Yun Heub

ArticleIssue Date2020CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.20, no.1, pp.119 - 126PublisherIEEK PUBLICATION CENTER
SCIESCOPUSKCI
Effect of Bottom Electrode Size on Ovonic Threshold Switch(OTS) CharacteristicsGo to Link

An, Byung-Kwon; Kim, Seong-Beom; Song, Yun Heub

ArticleIssue Date2020CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.20, no.1, pp.8 - 11PublisherIEEK PUBLICATION CENTER
SCIESCOPUSKCI
Compensation of Transfer Function Mismatch in a Two-stage MASH ADC with a Single SAR QuantizerGo to Link

Im, Saemin; Shin, Jong-Yoon; Park, Sang Gyu

ArticleIssue Date2019CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.19, no.5, pp.485 - 491PublisherIEEK PUBLICATION CENTER
SCIESCOPUSKCI
Improving Ring-oscillator-based True Random Number Generators using Multiple SamplingGo to Link

Choi, Piljoo; Kim, Ji-Hoon; Kim, Dong Kyue

ArticleIssue Date2019CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.19, no.3, pp.305 - 309PublisherIEEK PUBLICATION CENTER
SCIESCOPUSKCI
Secure Integrated Circuit with Physical Attack Detection based on Reconfigurable Top Metal ShieldGo to Link

Mun, Yeongjin; Kim, Hyungseup; Lee, Byeoncheol; Han, Kwonsang; Kim, Jaesung; Kim, Ji-Hoon; CHOI, BYONG DEOK; Kim, Dong Kyue; Ko, Hyoungho

ArticleIssue Date2019CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.19, no.3, pp.260 - 269PublisherIEEK PUBLICATION CENTER
SCIESCOPUSKCI
Vertical Channel NAND Flash Structure using DSCG(Double-Side-Control-Gate) to Reduce Cell to Cell InterferenceGo to Link

Choi, Seonjun; Song, Yun Heub

ArticleIssue Date2018CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.18, no.6, pp.714 - 722PublisherIEEK PUBLICATION CENTER
SCIESCOPUSKCI
DRBAC: Dynamic Row Buffer Access Control for Power and Performance of DRAM SystemsGo to Link

Jeon, Dong-Ik; Chung, Ki Seok

ArticleIssue Date2018CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.18, no.3, pp.307 - 314PublisherIEEK PUBLICATION CENTER
SCIESCOPUSKCI
Analysis of Anomalously Large RTS Noise Amplitudes in Tunneling Field-effect TransistorsGo to Link

Kim, So-Yeong; Oh, Dong-Jun; Kwon, Sung-Kyu; Song, Hyeong-Sub; Lim, Dong-Hwan; Choi, Chang-Hwan; Lee, Ga-Won; Lee, Hi-Deok

ArticleIssue Date2018CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.18, no.2, pp.193 - 199PublisherIEEK PUBLICATION CENTER
SCIESCOPUSKCI
Investigation of Wafer Warpage Induced by Multi-layer FilmsGo to Link

Nam, Byung-Wook; Park, Jea Gun

ArticleIssue Date2018CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.18, no.1, pp.7 - 13PublisherIEEK PUBLICATION CENTER
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