Observation of bias-dependent noise sources in a TiOx/TiOy bipolar resistive switching frame
- Authors
- Kim, Joo Hyung; Lee, Ah Rahm; Bae, Yoon Cheol; Baek, Kwang Ho; Im, Hyun Sik; Hong, Jin Pyo
- Issue Date
- Feb-2014
- Publisher
- AMER INST PHYSICS
- Citation
- APPLIED PHYSICS LETTERS, v.104, no.8, pp.1 - 5
- Indexed
- SCIE
SCOPUS
- Journal Title
- APPLIED PHYSICS LETTERS
- Volume
- 104
- Number
- 8
- Start Page
- 1
- End Page
- 5
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/143629
- DOI
- 10.1063/1.4865783
- ISSN
- 0003-6951
- Abstract
- We report the conduction features associated with the evolution of oxygen ions (or vacancies) under bias for a TiOx (oxygen ion-rich)/TiOy (oxygen ion-deficient) bi-layer cell by identifying low-frequency noise sources. It is believed that a low resistance state enhances the formation of conductive filaments exchanging electrons through a nearest-neighbor hopping process, while a high resistance state (HRS) emphasizes the rupture of conductive filaments inside the insulating TiOx layer and a reduction/oxidation reaction at the oxide interfaces. The high resolution transmission electron microscope images of as-grown and HRS cells are also discussed.
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