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Cited 29 time in webofscience Cited 32 time in scopus
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Highly stable solution-processed ZnO thin film transistors prepared via a simple Al evaporation process

Authors
Kang, Tae SungKim, Tae YoonLee, Gyu MinSohn, Hyun ChulHong, Jin Pyo
Issue Date
Feb-2014
Publisher
ROYAL SOC CHEMISTRY
Citation
JOURNAL OF MATERIALS CHEMISTRY C, v.2, no.8, pp.1390 - 1395
Indexed
SCIE
SCOPUS
Journal Title
JOURNAL OF MATERIALS CHEMISTRY C
Volume
2
Number
8
Start Page
1390
End Page
1395
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/143632
DOI
10.1039/c3tc32341b
ISSN
2050-7526
Abstract
Amorphous metal oxide thin film transistors (TFTs) are expected to serve as building blocks in a variety of devices, such as bendable displays, transparent mobile phones, and plastic newspapers. Here, we report a simple approach for highly stable solution-based zinc oxide (ZnO) TFTs by simply evaporating Al on the back channel layer without any additional chemical or plasma process for passivation. In particular, control and manipulation of Al nanoparticle (NP) formation represents one of the key approaches in this work. The possible sketch of the improved nature is proposed, along with various structural and electrical analyses.
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