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A study of encapsulation structure for TFT reliability in top emission OLED display
- Issue Date
- Nov-2019
- Publisher
- International Display Workshops
- Keywords
- Encapsulation; Hydrogen; Multilayer; Oxide
- Citation
- Proceedings of the International Display Workshops, v.2, pp.910 - 913
- Indexed
- SCOPUS
- Journal Title
- Proceedings of the International Display Workshops
- Volume
- 2
- Start Page
- 910
- End Page
- 913
- ISSN
- 1883-2490
- Abstract
- Preventing hydrogen and water vapor from permeating through encapsulation layer plays an important role in TFT Reliability. To improve a blocking characteristic, enca psulation inorganic layers were studied. A multilayered ino rganic deposition method for Organic Light Emitting Displ ay has been developed to obtain a reliable performance. SiNx and SiO2 were used to create a multilayered structur e of the inorganic encapsulation and its blocking ability against hydrogen, water vapor permeation was compared with a single inorganic encapsulation. In conclusion, the inorganic multi-structure of encapsulation has shown an advanced performance in blocking.
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Related Researcher
- Jeong, Jae Kyeong
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)