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Hyperspectral Raman Line Mapping as an Effective Tool To Monitor the Coating Thickness of Pharmaceutical Tablets

Authors
Song, Si WonKim, JaejinEum, ChanghwanCho, YounghoPark, Chan RyangWoo, Young-AhKim, Hyung MinChung, Hoeil
Issue Date
May-2019
Publisher
AMER CHEMICAL SOC
Citation
ANALYTICAL CHEMISTRY, v.91, no.9, pp.5810 - 5816
Indexed
SCIE
SCOPUS
Journal Title
ANALYTICAL CHEMISTRY
Volume
91
Number
9
Start Page
5810
End Page
5816
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/147895
DOI
10.1021/acs.analchem.9b00047
ISSN
0003-2700
Abstract
Protective chemical coatings are deposited on drugs during the manufacturing process for the purpose of controlling the pharmacokinetics of active pharmaceutical ingredients (APIs). Although manufacturers attempt to coat all the tablets uniformly, the film thickness of an individual drug is statistically different and depends on the measuring position of the anisotropic structure, and analytical methods for measuring coating thickness must be robust to statistical and geometrical aberrations. Herein, we demonstrate that a spatially offset Raman-spectroscopy-based line mapping method offered excellent calibration and prediction of the coating thickness of 270 acetaminophen (N-acetyl-para-aminophenol, paracetamol) tablets. Raman-scattered light resurfaced back from the coating and APIs, and offset-resolved spectra were projected according to the vertical positions in an imaging sensor. The Raman intensity ratio between the coating substance and the inner APIs is a key parameter in the analysis, and its variation with respect to the spatial offset is proportional to the coating thickness and duration. The results of this study have implications for the rapid spectroscopic thickness measurement of industrial products coated with transparent or translucent materials.
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