Bipolar, complementary resistive switching and synaptic properties of sputtering deposited ZnSnO-based devices for electronic synapses
- Authors
- Ismail, Muhammad; Mahata, Chandreswar; Abbas, Haider; Choi, Changhwan; Kim, Sungjun
- Issue Date
- May-2021
- Publisher
- Elsevier Ltd
- Keywords
- Impact of active electrodes; Effect of current compliance limitations; Complementary resistive switching; Synaptic plasticity; Neuromorphic computing; Filamentary switching
- Citation
- Journal of Alloys and Compounds, v.862, pp.1 - 10
- Indexed
- SCIE
SCOPUS
- Journal Title
- Journal of Alloys and Compounds
- Volume
- 862
- Start Page
- 1
- End Page
- 10
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/1478
- DOI
- 10.1016/j.jallcom.2020.158416
- ISSN
- 0925-8388
- Abstract
- In this work, ZnSnO-based resistive switching (RS) devices were fabricated with different top electrodes (TEs) to investigate the RS and synaptic characteristics for neuromorphic systems. The Ta/ZnSnO/TiN device exhibits excellent endurance (2000 DC cycles), longer retention (104 s), reliable multilevel retention (103 s) with six distinct resistance states via controlling the reset-stop voltage, and low forming/set voltages with high uniformity. Besides, complementary RS (CRS) behavior is observed in Ta/ZnSnO/TiN device at appropriate current compliance (CC, 5 mA) instead of low (600 μA) and high (10 mA) CC, respectively. X-ray photoelectron spectroscopy (XPS) analysis confirms that both TaO and TiON interface layers are formed at the top Ta/ZnSnO and bottom ZnSnO/TiN interfaces, which are found responsible for CRS behavior. Furthermore, XPS analysis also confirmed that the concentration of oxygen vacancies near the bottom ZnSnO/TiON interface is greater than the oxygen vacancies concentration near the top TaO/ZnSnO interface. Based on the XPS analysis, the switching phenomenon is confined in ZnSnO/TaON bottom interface because of its higher oxygen vacancy levels (prevent oxygen loss) in contrast to the TaO/ZnSnO top interface where the ZnSnO layer acts as series resistances in between these two interfaces. The basic features of an artificial synapse, LTP/ LTD, PPF/ PPD, and STDP, were successfully emulated using a Ta/ZnSnO/TiN device, suggesting potential applications for neuromorphic hardware systems.
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