Partial accelerated degradation test plans for Wiener degradation processes
DC Field | Value | Language |
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dc.contributor.author | Lim, Heonsang | - |
dc.contributor.author | Kim, Yong Soo | - |
dc.contributor.author | Bae, Suk Joo | - |
dc.contributor.author | Sung, Si-Il | - |
dc.date.accessioned | 2022-07-10T14:55:55Z | - |
dc.date.available | 2022-07-10T14:55:55Z | - |
dc.date.created | 2021-05-12 | - |
dc.date.issued | 2019-01 | - |
dc.identifier.issn | 1684-3703 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/148527 | - |
dc.description.abstract | Securing reliability information on newly developed products is difficult, as only a few samples are available in the development stage. In practice, life tests for new products are conducted under both the normal use condition and accelerated stress conditions. In this study, a two-phase partially accelerated degradation test (PADT) is proposed, which is designed to efficiently obtain product lifetime information in the development stage for new products, when reliability-related information is generally limited and there is limited sample availability. In the first phase, a two-stress-level PADT plan is developed to estimate the parameters of an accelerated degradation model based on the D-optimality criterion. In the second phase, a three-stress-level compromise plan is developed such that the asymptotic variance of maximum likelihood estimate of q-th quantile of the lifetime distribution under the use condition is minimized. Finally, the two-phase systematic test plan is illustrated with a numerical example. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | NCTU-NATIONAL CHIAO TUNG UNIV PRESS | - |
dc.title | Partial accelerated degradation test plans for Wiener degradation processes | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Bae, Suk Joo | - |
dc.identifier.doi | 10.1080/16843703.2017.1368968 | - |
dc.identifier.scopusid | 2-s2.0-85028544313 | - |
dc.identifier.wosid | 000456947900005 | - |
dc.identifier.bibliographicCitation | QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT, v.16, no.1, pp.67 - 81 | - |
dc.relation.isPartOf | QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT | - |
dc.citation.title | QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT | - |
dc.citation.volume | 16 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 67 | - |
dc.citation.endPage | 81 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Operations Research & Management Science | - |
dc.relation.journalResearchArea | Mathematics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Industrial | - |
dc.relation.journalWebOfScienceCategory | Operations Research & Management Science | - |
dc.relation.journalWebOfScienceCategory | Statistics & Probability | - |
dc.subject.keywordPlus | LIFE TESTS | - |
dc.subject.keywordPlus | OPTIMAL-DESIGN | - |
dc.subject.keywordPlus | PRODUCTS | - |
dc.subject.keywordPlus | WEIBULL | - |
dc.subject.keywordPlus | GAMMA | - |
dc.subject.keywordAuthor | Asymptotic variance | - |
dc.subject.keywordAuthor | compromise plan | - |
dc.subject.keywordAuthor | D-optimality | - |
dc.subject.keywordAuthor | partially accelerated degradation test | - |
dc.subject.keywordAuthor | reliability | - |
dc.subject.keywordAuthor | Wiener process | - |
dc.identifier.url | https://www.tandfonline.com/doi/full/10.1080/16843703.2017.1368968 | - |
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