Partial accelerated degradation test plans for Wiener degradation processes
- Authors
- Lim, Heonsang; Kim, Yong Soo; Bae, Suk Joo; Sung, Si-Il
- Issue Date
- Jan-2019
- Publisher
- NCTU-NATIONAL CHIAO TUNG UNIV PRESS
- Keywords
- Asymptotic variance; compromise plan; D-optimality; partially accelerated degradation test; reliability; Wiener process
- Citation
- QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT, v.16, no.1, pp.67 - 81
- Indexed
- SCIE
SCOPUS
- Journal Title
- QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT
- Volume
- 16
- Number
- 1
- Start Page
- 67
- End Page
- 81
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/148527
- DOI
- 10.1080/16843703.2017.1368968
- ISSN
- 1684-3703
- Abstract
- Securing reliability information on newly developed products is difficult, as only a few samples are available in the development stage. In practice, life tests for new products are conducted under both the normal use condition and accelerated stress conditions. In this study, a two-phase partially accelerated degradation test (PADT) is proposed, which is designed to efficiently obtain product lifetime information in the development stage for new products, when reliability-related information is generally limited and there is limited sample availability. In the first phase, a two-stress-level PADT plan is developed to estimate the parameters of an accelerated degradation model based on the D-optimality criterion. In the second phase, a three-stress-level compromise plan is developed such that the asymptotic variance of maximum likelihood estimate of q-th quantile of the lifetime distribution under the use condition is minimized. Finally, the two-phase systematic test plan is illustrated with a numerical example.
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