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Sensitivity-Based Fault Detection and Isolation Algorithm for Road Vehicle Chassis Sensorsopen access

Authors
Na, WonbinPark, ChangwooLee, SeokjooYu, SeongoLee, Hyeongcheol
Issue Date
Aug-2018
Publisher
MDPI
Keywords
road vehicle; fault diagnosis; fault detection and isolation; sensitivity analysis; model-in-the-loop; hardware-in-the-loop
Citation
SENSORS, v.18, no.8, pp.1 - 39
Indexed
SCIE
SCOPUS
Journal Title
SENSORS
Volume
18
Number
8
Start Page
1
End Page
39
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/149565
DOI
10.3390/s18082720
ISSN
1424-8220
Abstract
Vehicle control systems such as ESC (electronic stability control), MDPS (motor-driven power steering), and ECS (electronically controlled suspension) improve vehicle stability, driver comfort, and safety. Vehicle control systems such as ACC (adaptive cruise control), LKA (lane-keeping assistance), and AEB (autonomous emergency braking) have also been actively studied in recent years as functions that assist drivers to a higher level. These DASs (driver assistance systems) are implemented using vehicle sensors that observe vehicle status and send signals to the ECU (electronic control unit). Therefore, the failure of each system sensor affects the function of the system, which not only causes discomfort to the driver but also increases the risk of accidents. In this paper, we propose a new method to detect and isolate faults in a vehicle control system. The proposed method calculates the constraints and residuals of 12 systems by applying the model-based fault diagnosis method to the sensor of the chassis system. To solve the inaccuracy in detecting and isolating sensor failure, we applied residual sensitivity to a threshold that determines whether faults occur. Moreover, we applied a sensitivity analysis to the parameters semi-correlation table to derive a fault isolation table. To validate the FDI (fault detection and isolation) algorithm developed in this study, fault signals were injected and verified in the HILS (hardware-in-the-loop simulation) environment using an RCP (rapid control prototyping) device.
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