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Recovery Behavior of Mechanically Degraded a-IGZO TFT and Defect Speculation with TCAD Simulation Under Various Rolling Stresses
- Authors
- 박진성
- Issue Date
- 29-Aug-2019
- Place
- HICO, Gyeongju, Korea
- Conference Name
- International Meeting on Information Display (IMID) 2019
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Collections - 서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers
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Related Researcher
- Park, Jinseong
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)