Bayesian estimation for drop fragility of smart mobile phone display

Abstract

Drop-induced failures are one of the most dominant failure modes of smart mobile phone. The weakest link theory provides the failure mechanisms that account for the drop fragility of smart mobile phone display. Based on weakest link theory, th Weibull distribution has been widely used to model strength distributionof an item. In this paper, we propose a Bayesian approach for the Weibull distribution based on left, right, and interval censored data to model drop fragility of smart mobile phone display. Finally, simulation study is carried out to compare the performances of the proposed method.