Estimation of Thermal Conductivity of Amorphous Silicon Thin Films from the Optical Reflectivity Measurement
- Authors
- Moon, Seung-Jae; Choi, Jung Hyun
- Issue Date
- Sep-2013
- Publisher
- AMER SCIENTIFIC PUBLISHERS
- Keywords
- Thermal Conductivity; Optical Properties; Amorphous Silicon; Reflectivity; Heat Conduction
- Citation
- JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.13, no.9, pp.6362 - 6366
- Indexed
- SCIE
SCOPUS
- Journal Title
- JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
- Volume
- 13
- Number
- 9
- Start Page
- 6362
- End Page
- 6366
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/162036
- DOI
- 10.1166/jnn.2013.7712
- ISSN
- 1533-4880
- Abstract
- Amorphous silicon (a-Si) thin film material is widely used in liquid crystal display and solar cell applications. Knowledge of its properties is important in enhancing device performance. The properties of a-Si thin film have not been well understood due to the lack of periodicity of the structure. Furthermore, thermal conductivity of a-Si thin film is a key parameter to understand the complex phase transformation mechanism from a-Si thin film to polysilicon thin film by analyzing the transient temperature during the laser recrystallization process. In this work, thermal conductivity of a-Si thin film was determined by measuring optical reflectivity. A-Si thin film was irradiated with a KrF excimer laser beam to raise its temperature. The raised film temperature affects temperature-dependent optical properties such as refractive indices and extinction coefficients. The temperature-dependent optical properties of refractive indices and extinction coefficients of a-Si thin film were measured by ellipsometry. In-situ transient reflectivity at the wavelength of 633 nm was obtained during the excimer laser irradiation. The numerical simulation of one-dimensional conduction equation was solved so that transient reflectivities were calculated with temperature-dependent optical properties combined with thin film optics. Therefore, a well-fitted thermal conductivity was determined by comparing the numerically obtained transient reflectivity with the experimentally measured reflectivity data. The determined thermal conductivity of a-Si thin films was 1.5 W/mk.
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