Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

The estimation of dielectric constant of thick film using Vickers indentation

Authors
Kim, Hyeong-JunKim, KibumKim, JongcheolYoon, Kyung-HanShin, Dongwook
Issue Date
Nov-2012
Publisher
KOREAN ASSOC CRYSTAL GROWTH, INC
Keywords
Ceramic thick film; Dielectric constant; Hardness; Porosity
Citation
JOURNAL OF CERAMIC PROCESSING RESEARCH, v.13, pp.S241 - S245
Indexed
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF CERAMIC PROCESSING RESEARCH
Volume
13
Start Page
S241
End Page
S245
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/164349
DOI
10.36410/jcpr.2012.13..241
ISSN
1229-9162
Abstract
The barrier rib on plasma display panel (PDP) is a typical 3D-patterned thick film with thickness of 120 pm and it is hard to measure its dielectric constant in this state of the product. Because the porosity of ceramic thick film influenced the mechanical and dielectric characteristics, it was expected that there was the relationship between two properties. Therefore, the correlation analysis between porosity, hardness and dielectric constant of the barrier rib was studied and the exponential curve between porosity and hardness, and the quadratic curve between porosity and dielectric constant were drawn. The dielectric constant was well related to hardness by K-100kHz = 0.5672 + 5.695 ln(Hv). The hardness was measured at five points on two real panels which sintered by two types of profiles and then dielectric constants and deviation were estimated by the above equation.
Files in This Item
Go to Link
Appears in
Collections
서울 공과대학 > 서울 신소재공학부 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher SHIN, DONG WOOK photo

SHIN, DONG WOOK
COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE