Electronic Structures and Carrier Distributions of T-Shaped AlxGa1-xAs/AlyGa1-yAs Quantum Wires Fabricated by a Cleaved-Edge Overgrowth Method
- Authors
- Kim, D. H.; You, J. H.; Kim, J. H.; Yoo, K. H.; Kim, T. W.
- Issue Date
- Jul-2012
- Publisher
- American Scientific Publishers
- Keywords
- T-Shaped AlxGa1-xAs/AlyGa1-y As Quantum Wire; Probabilistic Electron Confinement; Deformation Potential; Interband Transition
- Citation
- Journal of Nanoscience and Nanotechnology, v.12, no.7, pp 5687 - 5690
- Pages
- 4
- Indexed
- SCI
SCIE
SCOPUS
- Journal Title
- Journal of Nanoscience and Nanotechnology
- Volume
- 12
- Number
- 7
- Start Page
- 5687
- End Page
- 5690
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/165185
- DOI
- 10.1166/jnn.2012.6391
- ISSN
- 1533-4880
1533-4899
- Abstract
- The electronic structures and carrier distributions of T-shaped AlxGa1-xAs/Al(y)Gal(1-y)As quantum wire (QWR) consisting of crossed arm and stem wells were numerically calculated by using a finite-difference method (FDM). The electronic subband energies in the arm and the stem wells were numerically calculated by using the FDM taking into account two-band Hamiltonian systems considering with and without strain and nonparabolicity effects. The band deformation due to strain and the probabilistic electron confinement of T-shaped AlxGa1-xAs/Al(y)Gal(1-y)As QWRs were also calculated. The transition energy from the ground heavy-hole state (HH1) to the ground electron state (E-1) was 1.584 eV when the strain was not considered and 1.585 eV when the strain effects were included. The excitonic peak energies corresponding to the interband transitions (E-1-HH1) in the T-shaped QWRs determined from the photoluminescence spectra were compared favorably with those determined from the FDM calculations.
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