Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
"Double-layer" method to improve image quality of industria SPECT
- Authors
- Park, Jang Guen; Seo, Hyeonglim; Kim, Chan Hyeong; Jung, Seunghun; Kim, Jongbum; Moon, Jinho; Kim, Yeong Sam
- Issue Date
- Jan-2012
- Publisher
- IOP PUBLISHING LTD
- Keywords
- Inspection with gamma rays; Detection of defects
- Citation
- JOURNAL OF INSTRUMENTATION, v.7, no.1, pp.1 - 2
- Indexed
- SCIE
SCOPUS
- Journal Title
- JOURNAL OF INSTRUMENTATION
- Volume
- 7
- Number
- 1
- Start Page
- 1
- End Page
- 2
- ISSN
- 1748-0221
- Files in This Item
- Go to Link
- Appears in
Collections - 서울 공과대학 > 서울 원자력공학과 > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Kim, Chan Hyeong
- COLLEGE OF ENGINEERING (DEPARTMENT OF NUCLEAR ENGINEERING)