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Effects of RF bias power on electron energy distribution function and plasma uniformity in inductively coupled argon plasma

Authors
Lee, Hyo-ChangBang, Jin-YoungChung, Chin-Wook
Issue Date
Aug-2011
Publisher
Elsevier Sequoia
Keywords
Biased inductively coupled plasma; RF bias power; Plasma density; Electron energy distribution; Plasma uniformity; Electron heating
Citation
Thin Solid Films, v.519, no.20, pp 7009 - 7013
Pages
5
Indexed
SCI
SCIE
SCOPUS
Journal Title
Thin Solid Films
Volume
519
Number
20
Start Page
7009
End Page
7013
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/167874
DOI
10.1016/j.tsf.2011.01.218
ISSN
0040-6090
Abstract
Changes in the plasma non-uniformity and the electron energy distribution function (EEDF) by increasing RF bias power were observed in inductively coupled plasma using spatially resolved radial EEDF measurements. As the bias power was increased at a fixed ICP power at a low gas pressure, The EEDF was evolved from a bi-Maxwellian to a Maxwellian distribution. The plasma density was decreased in all radial positions and thus plasma non-uniformity was slightly changed. However, strongly improved plasma spatial non-uniformity was observed at a high gas pressure with a decrease in the center-plasma density and an increase in the radial edge-plasma density. This result could be understood by combined effects of the ion acceleration loss and the non-uniform power deposition due to the RF bias power.
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