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Effects of SiO2 Encapsulation and Laser Processing on Single CdTe/ZnTe Quantum Dots Grown on Si (001) Substrates

Authors
Lee, Hong SeokRastelli, ArmandoSchmidt, Oliver G.Kim, Tae WhanLee, In Won
Issue Date
Aug-2011
Publisher
KOREAN PHYSICAL SOC
Keywords
Single quantum dots; CdTe; Optical tuning; SiO2; Laser processing
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.59, no.2, pp.489 - 492
Indexed
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
Volume
59
Number
2
Start Page
489
End Page
492
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/167935
DOI
10.3938/jkps.59.489
ISSN
0374-4884
Abstract
Micro-photoluminescence (mu-PL) measurements are carried out to investigate the effects of SiO2 encapsulation and laser processing of single CdTe/ZnTe quantum dots (QDs) grown on Si (001) substrates by using molecular beam epitaxy and atomic layer epitaxy. After laser processing, the PI, peak shift for the 200-nm SiO2 capped single QD is larger than that of the as-grown sample. The large mu-PL peak shift in the 200-nm SiO2 capped sample is related to the compressive stress induced by the ZnTe cap layer during laser processing. These results indicate that SiO2 encapsulation and laser processing represent effective methods for achieving local wavelength tuning in single QDs.
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