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New BER Expression of MPSK
- Authors
- Jeong, Woojin; Lee, Jaeyoon; Yoon, Dongweon
- Issue Date
- May-2011
- Publisher
- Institute of Electrical and Electronics Engineers
- Keywords
- Bit error probability; gray coding; M-ary phase-shift keying (MPSK)
- Citation
- IEEE Transactions on Vehicular Technology, v.60, no.4, pp 1916 - 1924
- Pages
- 9
- Indexed
- SCI
SCIE
SCOPUS
- Journal Title
- IEEE Transactions on Vehicular Technology
- Volume
- 60
- Number
- 4
- Start Page
- 1916
- End Page
- 1924
- ISSN
- 0018-9545
1939-9359
- Abstract
- This paper provides a new, exact, and general expression involving 1-D and 2-D Q-functions for the bit error probability of M-ary phase-shift keying (MPSK) under additive white Gaussian noise (AWGN) and fading channels when Gray code bit mapping is employed. Regular patterns in the error probability expression of the kth bit are observed while developing the bit error rate (BER) expression. From these patterns, we then derive a new BER expression for the MPSK constellation.
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Related Researcher
- Yoon, Dongweon
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)