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Orientations of polycrystalline ZnO at the buried interface of oxide thin film transistors (TFTs): A grazing incidence X-ray diffraction studyopen access
- Issue Date
- Apr-2008
- Publisher
- WILEY-V C H VERLAG GMBH
- Keywords
- grazing-incidence X-ray diffraction; ZnO; thin film transistors
- Citation
- BULLETIN OF THE KOREAN CHEMICAL SOCIETY, v.29, no.4, pp.727 - 728
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- BULLETIN OF THE KOREAN CHEMICAL SOCIETY
- Volume
- 29
- Number
- 4
- Start Page
- 727
- End Page
- 728
- ISSN
- 0253-2964
- Appears in
Collections - 서울 자연과학대학 > 서울 화학과 > 1. Journal Articles
- 서울 공과대학 > 서울 공학교육혁신센터 > 1. Journal Articles
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Related Researcher
- Yoon, Tae Hyun
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF CHEMISTRY)