Effect of interface chemical properties on nonvolatile memory characteristics for small-molecule memory cells embedded with Ni nano-crystals surrounded by NiO
- Authors
- Seo, Sung-Ho; Nam, Woo-Sik; Kim, Jae-Suk; Lee, Sang-Yi; Shim, Tae-Hun; Park, Jea-Gun
- Issue Date
- Jan-2010
- Publisher
- ELSEVIER
- Keywords
- Small-molecule; Nonvolatile memory; Nano-crystal; Interface property
- Citation
- CURRENT APPLIED PHYSICS, v.10, no.1, pp.E32 - E36
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- CURRENT APPLIED PHYSICS
- Volume
- 10
- Number
- 1
- Start Page
- E32
- End Page
- E36
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/175575
- DOI
- 10.1016/j.cap.2009.12.008
- ISSN
- 1567-1739
- Abstract
- We investigated the effect of the chemical properties of the interface on nonvolatile memory characteristics for small-molecule memory cells embedded with Ni nano-crystals surrounded by a NiO tunneling barrier. We used ultra-high voltage TEM, Auger, and XPS to characterize the physical and chemical properties of the interface. It was found that the occurrence of chemical reactions between the small-molecule layers and the surface of the NiO tunneling barrier surrounding the Ni nano-crystals (e.g., NiCO3) conclusively determine nonvolatile memory characteristics such as memory margin (I-on/I-off ratio), retention time, and endurance cycles of writing and erasing.
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