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Bipolar resistance switching characteristics in a thin Ti-Ni-O compound film
- Authors
- Choi, Joonhyuk; Song, JaeHoon; Jung, Kyooho; Kim, Yongmin; Im, Hyunsik; Jung, Woong; Kim, Hyungsang; Do, Young Ho; Kwak, June Sik; Hong, Jinpyo
- Issue Date
- Apr-2009
- Publisher
- IOP PUBLISHING LTD
- Citation
- NANOTECHNOLOGY, v.20, no.17, pp.1 - 5
- Indexed
- SCIE
SCOPUS
- Journal Title
- NANOTECHNOLOGY
- Volume
- 20
- Number
- 17
- Start Page
- 1
- End Page
- 5
- ISSN
- 0957-4484
- Abstract
- Resistance switching phenomena in an amorphous Ni-Ti-O film were investigated. Very clear bipolar resistive switching characteristics were observed with good reproducibility. Stable retention and on/off pulse switching operation was demonstrated. An analysis of x-ray photoelectron spectroscopy of the Ni-Ti-O film provided a clue that the observed unusual bipolar resistance switching in the film is due to a microscopic change in the Ni-O and Ti-O binding states at the Ni-Ti-O film/electrode interface.
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Related Researcher
- Hong, Jin Pyo
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)