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Microphotoluminescence spectroscopy of single CdTe/ZnTe quantum dots grown on Si(001) substrates
- Authors
- Lee, Hong Seok; Rastelli, Armando; Benyoucef, Mohamed; Ding, Fei; Kim, Tae Whan; Park, Hong Lee; Schmidt, Oliver G.
- Issue Date
- Feb-2009
- Publisher
- Institute of Physics Publishing
- Citation
- Nanotechnology, v.20, no.7, pp 1 - 5
- Pages
- 5
- Indexed
- SCIE
SCOPUS
- Journal Title
- Nanotechnology
- Volume
- 20
- Number
- 7
- Start Page
- 1
- End Page
- 5
- ISSN
- 0957-4484
1361-6528
- Abstract
- We have studied the emission properties of single CdTe/ZnTe quantum dots (QDs) grown on Si(001) substrates by using molecular beam epitaxy and atomic layer epitaxy. The good quality of the QDs is attested by the resolution-limited emission, negligible background and absence of measurable spectral jitter or blinking. Power-dependent, polarization-dependent, and temperature-dependent microphotoluminescence spectroscopy measurements were performed to identify the exciton, the biexciton, and two oppositely charged excitons in the emission spectra of single QDs.
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