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Chip-on-glass bonding using sn bump and non-conductive adhesive for LCD application

Authors
Kim, Bae-YongChen, ZhigangKim, Young-Ho
Issue Date
Nov-2006
Publisher
Taylor & Francis
Keywords
chip-on-glass (COG); non-conductive adhesive (NCA); Sn bump; thermal cycling
Citation
Molecular Crystals and Liquid Crystals, v.458, pp 199 - 206
Pages
8
Indexed
SCIE
SCOPUS
Journal Title
Molecular Crystals and Liquid Crystals
Volume
458
Start Page
199
End Page
206
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/180807
DOI
10.1080/15421400600932363
ISSN
1542-1406
1543-5318
Abstract
We developed a new chip-on-glass (COG) bonding method using non-conductive adhesive (NCA) and Sn bumps. The bonding was performed with various electrode pads on the glass substrate at 150 degrees C for 150 s under 100 MPa. The initial average contact resistance was 5.7m Omega for Au pad, 19.6m Omega for indium-tin oxide (ITO)/Au pad, 11.2m Omega for Al pad respectively. Thermal cycling test was performed in the temperature range between 0 degrees C and 100 degrees C. The contact resistance of the Sn bump-Au pad joints did not change even after 1000 cycles. In contrast, the joints formed on other type of pads failed electrically between 300 and 500 cycles.
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서울 공과대학 > 서울 신소재공학부 > 1. Journal Articles

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