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Effect of thermal annealing on structural, electrical, and magnetic properties of Ag-doped La0.67Ca0.33MnO3 thin films grown on LaAlO3 substrates
- Issue Date
- Feb-2006
- Publisher
- JAPAN SOC APPLIED PHYSICS
- Keywords
- Ag-doped La0.67Ga0.33MnO3; thermal annealing; electrical property; magnetic property; magnetoresistance ratio
- Citation
- JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.2A, pp.727 - 729
- Indexed
- SCIE
SCOPUS
- Journal Title
- JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS
- Volume
- 45
- Number
- 2A
- Start Page
- 727
- End Page
- 729
- ISSN
- 0021-4922
- Abstract
- Resistance as a function of temperature showed that the metal-insulator transition temperatures of as-grown and annealed Ag-doped La0.67Ca0.33MnO3 thin films were 235 and 300 K, respectively, and that the metal-insulator transition ranges of these films were relatively narrow, indicative of a sharp phase transition. The temperature coefficient of resistance was as high as 8% at 276 K. The magnetoresistance ratio of the annealed Ag-doped film under a magnetic field of 5 T was approximately 55% at 285 K.
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