Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
반도체 분야 난제 해결을 위한 AI 기반의 THz 비파괴검사기술 개발
- Authors
- 김학성
- Issue Date
- 27-May-2022
- Place
- 더케이호텔 경주
- Conference Name
- 2022년 한국비파괴검사학회 춘계학술대회
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 공과대학 > 서울 기계공학부 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Kim, Hak Sung
- COLLEGE OF ENGINEERING (SCHOOL OF MECHANICAL ENGINEERING)