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Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact Failure Probability in 180 nm, 130 nm, and 28 nm CMOS Processes
- Authors
- 최병덕
- Issue Date
- 27-Jun-2022
- Place
- 미국 Washington D.C
- Conference Name
- IEEE International Symposium on Hardware Oriented Security and Trust
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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Related Researcher
- CHOI, BYONG DEOK
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)