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STUDY ON CURE SHRINKAGE OF EMC USING DIELECTRIC SENSOR AND FBG SENSOR

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dc.contributor.authorBaek, Jeong-Hyeon-
dc.contributor.authorPark, Dong-Woon-
dc.contributor.authorPark, Simon-
dc.contributor.authorKim, Hak Sung-
dc.date.accessioned2023-05-03T09:38:48Z-
dc.date.available2023-05-03T09:38:48Z-
dc.date.created2023-04-06-
dc.date.issued2022-06-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/184837-
dc.description.abstractThe curing status and internal strain of epoxy molding compound (EMC) were monitored using a dielectric sensor and a fiber Bragg grating (FBG) sensor under curing conditions similar to the actual semiconductor packaging process. The dissipation factor was measured with a dielectric sensor during the molding process, and a gelation point, which is the starting point of effective cure shrinkage, was defined. Also, differential scanning calorimetry (DSC) test and rheometer test were performed and analyzed with dielectrometry measurement. In addition, Bragg wavelength (BW) was measured with the FBG sensor during the whole curing process and the cure shrinkage of the EMC was obtained. From these results, the effective cure shrinkage of the EMC that actually affects the residual stress of the EMC after curing processing was obtained.-
dc.language영어-
dc.language.isoen-
dc.publisherComposite Construction Laboratory (CCLab), Ecole Polytechnique Federale de Lausanne (EPFL)-
dc.titleSTUDY ON CURE SHRINKAGE OF EMC USING DIELECTRIC SENSOR AND FBG SENSOR-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Hak Sung-
dc.identifier.scopusid2-s2.0-85149180330-
dc.identifier.bibliographicCitationECCM 2022 - Proceedings of the 20th European Conference on Composite Materials: Composites Meet Sustainability, v.1, pp.1557 - 1564-
dc.relation.isPartOfECCM 2022 - Proceedings of the 20th European Conference on Composite Materials: Composites Meet Sustainability-
dc.citation.titleECCM 2022 - Proceedings of the 20th European Conference on Composite Materials: Composites Meet Sustainability-
dc.citation.volume1-
dc.citation.startPage1557-
dc.citation.endPage1564-
dc.type.rimsART-
dc.type.docTypeConference Paper-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusCuring-
dc.subject.keywordPlusDielectric devices-
dc.subject.keywordPlusElectric sensing devices-
dc.subject.keywordPlusElectromagnetic compatibility-
dc.subject.keywordPlusFiber Bragg gratings-
dc.subject.keywordPlusGelation-
dc.subject.keywordPlusMolding-
dc.subject.keywordPlusShrinkage-
dc.subject.keywordPlusDifferential scanning calorimetry-
dc.subject.keywordPlusA.Fibres-
dc.subject.keywordPlusCure shrinkage-
dc.subject.keywordPlusCuring condition-
dc.subject.keywordPlusDielectric fibers-
dc.subject.keywordPlusDielectric sensors-
dc.subject.keywordPlusEpoxy molding compounds-
dc.subject.keywordPlusFiber Bragg Grating Sensors-
dc.subject.keywordPlusGelation point-
dc.subject.keywordPlusInternal strains-
dc.subject.keywordPlusSemiconductor packaging-
dc.subject.keywordAuthorCure shrinkage-
dc.subject.keywordAuthorDielectric sensor-
dc.subject.keywordAuthorEMC-
dc.subject.keywordAuthorFBG sensor-
dc.subject.keywordAuthorGelation point-
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