Seo, Hogeon; Choi, Sungho; Jhang, Kyung-Young
ArticleIssue Date2014CitationFENDT 2014 - Proceedings, 2014 IEEE Far East Forum on Nondestructive Evaluation/Testing: New Technology and Application, Increasingly Perfect NDT/E, pp.221 - 224PublisherInstitute of Electrical and Electronics Engineers Inc.