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Soluble-processed aluminum doped yttrium oxide gate insulator for high performance amorphous oxide transistors

Authors
Lee, JiwonShin, YeonwooJeong, Jae Kyeong
Issue Date
Dec-2017
Publisher
International Display Workshops
Keywords
Aluminum yttrium oxide; Indium zinc oxide; Solution process; Ternary alloy; Thin-film transistor
Citation
Proceedings of the International Display Workshops, v.1, pp.410 - 412
Indexed
SCOPUS
Journal Title
Proceedings of the International Display Workshops
Volume
1
Start Page
410
End Page
412
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/18610
ISSN
1883-2490
Abstract
The low-cost spin-cast AI0.4Y1.6O3 films were prepared as the gate insulator for the IZO transistors. The ternary AI0.4Y1.6O3 films provide a smooth, high permittivity with excellent insulating properties compared to binary AI2O3 or Y2O3 films. This behavior can be attributed to the structure stabilization resulting from the cation alloying-mixing effect.
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Jeong, Jae Kyeong
COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)
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