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'A Novel Gate-All-Around with Back-gate (GAAB) Structure with Highly Scalable in 3-D NAND Flash Memory' 연구 발표
- Authors
- 송윤흡
- Issue Date
- 28-Jun-2023
- Place
- 롯데호텔 제주 중문
- Conference Name
- 2023년 대한전자공학회 하계종합학술대회
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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Related Researcher
- Song, Yun Heub
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)