Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Comprehensive TCAD-Based Validation of Interface Trap-Assisted Ferroelectric Polarization in Ferroelectric-Gate Field-Effect Transistor Memory

Authors
Lee, KitaeKim, SihyunKim, MunhyeonLee, Jong-HoKwon, DaewoongPark, Byung-Gook
Issue Date
Mar-2022
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Iron; FeFETs; Tunneling; Capacitors; Logic gates; Tin; Electron traps; Ferroelectric; ferroelectric-gate field-effect transistor (FeFET); interface trap; memory; polarization; technology computer-aided design (TCAD)
Citation
IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.3, pp.1048 - 1053
Indexed
SCIE
SCOPUS
Journal Title
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume
69
Number
3
Start Page
1048
End Page
1053
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/188665
DOI
10.1109/TED.2022.3144965
ISSN
0018-9383
Abstract
In this article, the interface trap-assisted ferroelectric polarization in ferroelectric-gate field effect transistors (FeFETs) is investigated based on technology computer-aided design (TCAD) simulations. The metal-ferroelectric-metal (MFM) capacitors and FeFETs are fabricated to reflect ferroelectric and device model parameters to the simulations. By introducing interface traps between ferroelectric layer and Interlayer (FE/IL) and implementing the charge trapping through nonlocal tunneling model, it is revealed that the trapped charges at the FE/IL interface enhance the polarization of the FE, and they determine a memory window (MW) by the compensation between the polarization enhancement and the trapping-induced threshold voltage shift. Furthermore, the effects of the remaining trapped charges depending on a trap relaxation on the MW are rigorously analyzed by monitoring the transient changes of the polarization and the trapped charges in pulse program/read operations.
Files in This Item
Go to Link
Appears in
Collections
서울 공과대학 > 서울 융합전자공학부 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kwon, Daewoong photo

Kwon, Daewoong
COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE