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Wafer-recyclable, environment-friendly transfer printing for large-scale thin-film nanoelectronics

Authors
Wie, Dae SeungZhang, YueKim, Min KuKim, BongjoongPark, SangwookKim, Young-JoonIrazoqui, Pedro P.Zheng, XiaolinXu, BaoxingLee, Chi Hwan
Issue Date
Jul-2018
Publisher
NATL ACAD SCIENCES
Keywords
transfer printing method; thin-film nanoelectronics; Internet of Things; delaminationnondestructive wafer recycling
Citation
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, v.115, no.31, pp E7236 - E7244
Indexed
SCI
SCIE
SCOPUS
Journal Title
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA
Volume
115
Number
31
Start Page
E7236
End Page
E7244
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/190816
DOI
10.1073/pnas.1806640115
ISSN
0027-8424
1091-6490
Abstract
Transfer printing of thin-film nanoelectronics from their fabrication wafer commonly requires chemical etching on the sacrifice of wafer but is also limited by defects with a low yield. Here, we introduce a wafer-recyclable, environment-friendly transfer printing process that enables the wafer-scale separation of high-performance thin-film nanoelectronics from their fabrication wafer in a defect-free manner that enables multiple reuses of the wafer. The interfacial delamination is enabled through a controllable cracking phenomenon in a water environment at room temperature. The physically liberated thin-film nanoelectronics can be then pasted onto arbitrary places of interest, thereby endowing the particular surface with desirable add-on electronic features. Systematic experimental, theoretical, and computational studies reveal the underlying mechanics mechanism and guide manufacturability for the transfer printing process in terms of scalability, controllability, and reproducibility.
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