Modeling Single-Event Transient Propagation in a SiGe BiCMOS Direct-Conversion Receiveropen access
- Authors
- Ildefonso, Adrian; Song, Ickhyun; Tzintzarov, George N.; Fleetwood, Zachary E.; Lourenco, Nelson E.; Wachter, Mason T.; Cressler, John D.
- Issue Date
- Aug-2017
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- Quadrature modulation; RF receiver (RX); SEE testing; silicon-germanium (SiGe); single-event transients (SETs)
- Citation
- IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.64, no.8, pp.2079 - 2088
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE TRANSACTIONS ON NUCLEAR SCIENCE
- Volume
- 64
- Number
- 8
- Start Page
- 2079
- End Page
- 2088
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/193011
- DOI
- 10.1109/TNS.2017.2699478
- ISSN
- 0018-9499
- Abstract
- The propagation of single-event transient (SET) signals in a silicon-germanium direct-conversion receiver carrying modulated data is explored. A theoretical analysis of transient propagation, verified by simulation, is presented. A new methodology to characterize and quantify the impact of SETs in communication systems carrying modulated data is proposed. The proposed methodology uses a pulsed radiation source to induce distortions in the signal constellation. The error vector magnitude due to SETs can then be calculated to quantify errors. Two different modulation schemes were simulated: QPSK and 16-QAM. The distortions in the constellation diagram agree with the presented circuit theory. Furthermore, the proposed methodology was applied to evaluate the improvements in the SET response due to a known radiation-hardening-by-design (RHBD) technique, where the common-base device of the low-noise amplifier was operated in inverse mode. The proposed methodology can be a valid technique to determine the most sensitive parts of a system carrying modulated data.
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