Overcoming Hardware Imperfections in Optical Neural Networks through a Machine Learning-Driven Self-Correction Mechanismopen access
- Authors
- Kim, Minjoo; Kim, Beomju; Kim, Yelim; Handriani, Lia Saptini; Jang, Suhee; Jeong, Dae Yeop; Yang, Sung Ik; Park, Won Il
- Issue Date
- Apr-2024
- Publisher
- Institute of Electrical and Electronics Engineers
- Keywords
- Adaptive optics; Hardware; Hardware imperfections; Image color analysis; Matrix-Vector Multiplication (MVM); Optical computing; Optical crosstalk; Optical imaging; Optical Neural Networks (ONNs); Recognition accuracy; Self-correction approach; Training; Training algorithm
- Citation
- IEEE Photonics Journal, v.16, no.2, pp 1 - 8
- Pages
- 8
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE Photonics Journal
- Volume
- 16
- Number
- 2
- Start Page
- 1
- End Page
- 8
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/195160
- DOI
- 10.1109/JPHOT.2024.3361930
- ISSN
- 1943-0655
1943-0647
- Abstract
- We developed an optical neural network (ONN) for efficient processing and recognition of 2-dimensional (2D) images, employing a conventional liquid crystal display panel as optical neurons and synapses. This configuration allowed for optical signal outputs proportional to matrix-vector multiplication for 2D image inputs. However, our experimental results revealed a 26.6% decrease in the optical classification accuracy, despite utilizing digitally pre-trained parameters with 100% accuracy for 500 handwritten digits. This decline can be attributed to system imperfections associated with non-ideal functions of optical components and optical alignment. Rather than pursuing an elusive, imperfection-free ONN or attempting to calibrate these defects individually, we addressed these challenges by introducing a self-correction mechanism that utilizes a machine learning algorithm. This approach effectively restored the recognition accuracy and minimized loss of our ONN to levels comparable to the digitally pre-trained model. This study underscores the potential of constructing defect-tolerant hardware in ONNs through the application of machine learning techniques.
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