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Effect of E-Beams Irradiation Dose on the Sensing Properties of Pt-Functionalized Reduced Graphene Oxides Following Annealing of the 6 nm-Thick Pt Layer
- Authors
- Kwon, Yong Jung; Mhzaei, Ali; Na, Han Gil; Kong, Sung Yong; Choi, Myung Sik; Bang, Jae Hoon; Lee, Jaegab; Kane, Inpil; Kim, Sang Sub; Kim, Hyoun Woo
- Issue Date
- Jul-2017
- Publisher
- 대한금속·재료학회
- Keywords
- reduced graphene oxide; gas sensor; E-Beam irradiation; Pt nanoparticles; NO2
- Citation
- 대한금속·재료학회지, v.55, no.7, pp 492 - 502
- Pages
- 11
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- 대한금속·재료학회지
- Volume
- 55
- Number
- 7
- Start Page
- 492
- End Page
- 502
- ISSN
- 1738-8228
2288-8241
- Abstract
- Pt-functionalized RGO samples were prepared and subsequently irradiated with 2-MeV electron beams (e-beams). The effect of e-beam dose on the structural, electrical, and gas sensing properties of the samples was investigated. E-beam irradiation was found to induce significant microstructural changes in the Pt-functionalized RGO. Measurements of NO₂ sensing at room temperature showed that the dose of 100 kGy led to better NO₂ sensing properties compared to those of unirradiated sensors. On the other hand, the dose of 500 kGy appeared to be excessive, leading to extensive damage of the RGO structure and a significant reduction in the response to NO₂ gas. E-beam irradiation can be beneficial for improving the gas sensing of Pt-functionalized RGO, but its dose needs to be optimized to obtain the best sensing properties.
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Related Researcher
- Kim, Hyoun Woo
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)