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GaSb/InGaAs 2-dimensional hole gas grown on InP substrate for III-V CMOS applications

Authors
Shin, SangHoonPark, YounHoKoo, HyunCheolSong, YunHeubSong, JinDong
Issue Date
Jul-2017
Publisher
The Korean Physical Society
Keywords
2DHG; GaSb; Hole mobility; Lattice mismatch; III-V CMOS
Citation
Current Applied Physics, v.17, no.7, pp 1005 - 1008
Pages
4
Indexed
SCI
SCIE
SCOPUS
KCI
Journal Title
Current Applied Physics
Volume
17
Number
7
Start Page
1005
End Page
1008
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/19568
DOI
10.1016/j.cap.2017.03.018
ISSN
1567-1739
1878-1675
Abstract
We grew a two-dimensional hole gas (2DHG) system using a GaSb quantum well layer sandwiched by InGaAs layers in Molecular Beam Epitaxy (MBE). The 2DHG quantum well was achieved using a spreading modulation doping method with Be-dopant. The cross-sectional STEM image clearly shows that large dislocations by lattice-mismatch are relaxed in all layers. We confirmed substantial valence and conduction band offsets in the 2DHG by simulated results. The electrical properties were also observed by Hall measurement, indicating a high hole mobility of 653 ㎠/Vs and high carrier concentration of 4.3 x 10¹²/㎠ at RT.
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