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Improved Reliability of Plasma-Enhanced ALD-derived HfO2/IGZO Thin-Film Transistors
- Authors
- 정재경
- Issue Date
- 7-Dec-2023
- Place
- TOKI MESSE Niigata Convention Center
- Conference Name
- IDW
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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Related Researcher
- Jeong, Jae Kyeong
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)