Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Learning-based Mutant Reduction Using Fine-grained Mutation Operators
- Authors
- Kim, Yunho; Hong, Shin
- Issue Date
- Apr-2022
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Keywords
- Cost-considerate linear regression; Mutant reduction; Mutation analysis; Mutation operator; Mutation score prediction
- Citation
- Proceedings - 2022 IEEE 15th International Conference on Software Testing, Verification and Validation, ICST 2022, pp 464 - 464
- Pages
- 1
- Indexed
- SCOPUS
- Journal Title
- Proceedings - 2022 IEEE 15th International Conference on Software Testing, Verification and Validation, ICST 2022
- Start Page
- 464
- End Page
- 464
- ISSN
- 2159-4848
- Abstract
- This is an extended abstract of the article: Yunho Kim and SHin Hong, Learning-based Mutant Reduction Using Fine-grained Mutation Operators, Journal of Software Testing, Verification and Reliability, e1786, https://doi.org/10.1002/stvr.1786
- Files in This Item
- Go to Link
- Appears in
Collections - 서울 공과대학 > 서울 컴퓨터소프트웨어학부 > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Kim, Yunho
- COLLEGE OF ENGINEERING (SCHOOL OF COMPUTER SCIENCE)