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Photo-Induced Current Transient Defect Analyses of Oxide Semiconductor Materials by Fast Fourier Transformation and 1D Convolutional Neural Networks
- Authors
- 홍진표
- Issue Date
- 4-Jun-2024
- Place
- 제주도
- Conference Name
- the 21st international symposium on the physics of semiconductors and applications
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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Related Researcher
- Hong, Jin Pyo
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)