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Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation Tests Go to Link

Park, Jong In; Bae, Suk Joo

ArticleIssue Date2010CitationIEEE TRANSACTIONS ON RELIABILITY, v.59, no.1, pp.74 - 90PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

Bayesian degradation modeling for reliability prediction of organic light-emitting diodes Go to Link

Bae, Suk Joo; Yuan, Tao; Kim, Seong-joon

ArticleIssue Date2016CitationJOURNAL OF COMPUTATIONAL SCIENCE, v.17, pp.117 - 125PublisherELSEVIER SCIENCE BV

SCIESCOPUS

Yield Prediction for Integrated Circuits Manufacturing Through Hierarchical Bayesian Modeling of Spatial Defects Go to Link

Yuan, Tao; Ramadan, Saleem Z.; Bae, Suk Joo

ArticleIssue Date2011CitationIEEE TRANSACTIONS ON RELIABILITY, v.60, no.4, pp.729 - 741PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

Statistical Models of Overdispersed Spatial Defects for Predicting the Yield of Integrated Circuits Go to Link

Yuan, Tao; Bae, Suk Joo; Kuo, Yue

ArticleIssue Date2020CitationIEEE TRANSACTIONS ON RELIABILITY, v.69, no.2, pp.510 - 521PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

Mixed-Effects Nonhomogeneous Poisson Process Model for Multiple Repairable Systems Go to Link open access

Mun, Byeong Min; Kvam, Paul H.; Bae, Suk Joo

ArticleIssue Date2021CitationIEEE ACCESS, v.9, pp.71900 - 71908PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

Generalized linear mixed models for reliability analysis of multi-copy repairable systems Go to Link

Tan, Furong; Jiang, Zhibin; Bae, Suk Joo

ArticleIssue Date2007CitationIEEE TRANSACTIONS ON RELIABILITY, v.56, no.1, pp.106 - 114PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

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