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SCIE
SCOPUS
A Step-Down Test Procedure for Wavelet Shrinkage Using Bootstrapping
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open access
Lim, Munwon; Omitaomu, Olufemi A.;
Bae, Suk Joo
Article
Issue Date
2020
Citation
IEEE ACCESS, v.8, pp.174763 - 174772
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
1
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Author
Omitaomu, Olufemi A.
1
Subject
Air conditioning
1
Analytical results
1
Bootstrap aggregating
1
Bootstrapping method
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complex wavelet transform
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data-denoising
1
Error rate control
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Errors
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Fractional factorial experiments
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Shrinkage
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2020
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