Recent Progress, Opportunities and Properties in Polycrystalline Oxide TFTs
- Authors
- Kim, Gwang-Bok; Chung, Sang Won; Jeong, Jae Kyeong
- Issue Date
- Jun-2025
- Keywords
- Crystallization; indium zinc tin oxide; OLED; thin-film transistor (TFT)
- Citation
- Digest of Technical Papers - SID International Symposium, v.56, no.1, pp 734 - 736
- Pages
- 3
- Indexed
- SCOPUS
- Journal Title
- Digest of Technical Papers - SID International Symposium
- Volume
- 56
- Number
- 1
- Start Page
- 734
- End Page
- 736
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/209214
- DOI
- 10.1002/sdtp.18270
- ISSN
- 0097-966X
2168-0159
- Abstract
- This study explores advanced crystallization methods to enhance oxide TFT performance, addressing the demand for high-mobility, reliable semiconductors in large, ultra-highresolution OLEDs. While a-IGZO TFTs dominate current applications, evolving technologies necessitate improved crystalline quality, including optimized grain size and orientation. We highlight innovative manufacturing approaches and material science insights that offer potential solutions to the challenges of crystalline oxide semiconductors, paving the way for nextgeneration display technologies.
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