Non-contact measurement of the electrical conductivity and coverage density of silver nanowires for transparent electrodes using Terahertz spectroscopy
DC Field | Value | Language |
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dc.contributor.author | Park, Sung-Hyeon | - |
dc.contributor.author | Chung, Wan-Ho | - |
dc.contributor.author | Kim, Hak-Sung | - |
dc.date.accessioned | 2021-08-02T15:50:59Z | - |
dc.date.available | 2021-08-02T15:50:59Z | - |
dc.date.created | 2021-05-12 | - |
dc.date.issued | 2017-02 | - |
dc.identifier.issn | 0957-0233 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/21177 | - |
dc.description.abstract | In this work, a terahertz time-domain spectroscopy (THz-TDS) imaging technique was used for non-contact measurement of the conductivity and coverage density (DC) of silver nanowires (SNWs) as transparent electrodes. The reflection mode of THz-TDS with an incident angle of 30 degrees was used, and the sheet resistance (R-sh) of SNW films was measured using the four-point probe method. The correlations between the THz reflection ratio and Rsh were studied by comparing the results of the four-point probe method and the measured THz reflection ratios. Also, the DC of SNWs was evaluated using THz waveforms with a general refractivity formula. This result matched well with a conventional approximation method using a scanning electron microscope image. Furthermore, defects in the SNWs could be easily detected using the THz-TDS imaging technique. The non-contact THz-TDS measurement method that we developed is expected to be a promising technique for non-contact measurement of the Rsh and DC for transparent conductive electrodes. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.title | Non-contact measurement of the electrical conductivity and coverage density of silver nanowires for transparent electrodes using Terahertz spectroscopy | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Hak-Sung | - |
dc.identifier.doi | 10.1088/1361-6501/aa4ead | - |
dc.identifier.scopusid | 2-s2.0-85010991980 | - |
dc.identifier.wosid | 000391288100001 | - |
dc.identifier.bibliographicCitation | MEASUREMENT SCIENCE AND TECHNOLOGY, v.28, no.2, pp.1 - 8 | - |
dc.relation.isPartOf | MEASUREMENT SCIENCE AND TECHNOLOGY | - |
dc.citation.title | MEASUREMENT SCIENCE AND TECHNOLOGY | - |
dc.citation.volume | 28 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 8 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Engineering, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.subject.keywordPlus | REFRACTIVE-INDEX | - |
dc.subject.keywordPlus | FILM | - |
dc.subject.keywordPlus | OXIDE | - |
dc.subject.keywordAuthor | non-contact measurement | - |
dc.subject.keywordAuthor | sheet resistance | - |
dc.subject.keywordAuthor | coverage density | - |
dc.subject.keywordAuthor | transparent electrode | - |
dc.subject.keywordAuthor | silver nanowire | - |
dc.identifier.url | https://iopscience.iop.org/article/10.1088/1361-6501/aa4ead | - |
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