Non-contact measurement of the electrical conductivity and coverage density of silver nanowires for transparent electrodes using Terahertz spectroscopy
- Authors
- Park, Sung-Hyeon; Chung, Wan-Ho; Kim, Hak-Sung
- Issue Date
- Feb-2017
- Publisher
- IOP PUBLISHING LTD
- Keywords
- non-contact measurement; sheet resistance; coverage density; transparent electrode; silver nanowire
- Citation
- MEASUREMENT SCIENCE AND TECHNOLOGY, v.28, no.2, pp.1 - 8
- Indexed
- SCIE
SCOPUS
- Journal Title
- MEASUREMENT SCIENCE AND TECHNOLOGY
- Volume
- 28
- Number
- 2
- Start Page
- 1
- End Page
- 8
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/21177
- DOI
- 10.1088/1361-6501/aa4ead
- ISSN
- 0957-0233
- Abstract
- In this work, a terahertz time-domain spectroscopy (THz-TDS) imaging technique was used for non-contact measurement of the conductivity and coverage density (DC) of silver nanowires (SNWs) as transparent electrodes. The reflection mode of THz-TDS with an incident angle of 30 degrees was used, and the sheet resistance (R-sh) of SNW films was measured using the four-point probe method. The correlations between the THz reflection ratio and Rsh were studied by comparing the results of the four-point probe method and the measured THz reflection ratios. Also, the DC of SNWs was evaluated using THz waveforms with a general refractivity formula. This result matched well with a conventional approximation method using a scanning electron microscope image. Furthermore, defects in the SNWs could be easily detected using the THz-TDS imaging technique. The non-contact THz-TDS measurement method that we developed is expected to be a promising technique for non-contact measurement of the Rsh and DC for transparent conductive electrodes.
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