State-of-health estimation and remaining useful life prediction of lithium-ion batteries using DnCNN-CNN
- Authors
- Chae, Sun Geu; Bae, Suk Joo; Oh, Ki-Yong
- Issue Date
- Jan-2025
- Publisher
- Elsevier Ltd
- Keywords
- Bayesian optimization; Deep learning; Feature fusion; Health monitoring; Variational autoencoder
- Citation
- Journal of Energy Storage, v.106, pp 1 - 16
- Pages
- 16
- Indexed
- SCIE
SCOPUS
- Journal Title
- Journal of Energy Storage
- Volume
- 106
- Start Page
- 1
- End Page
- 16
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/212220
- DOI
- 10.1016/j.est.2024.114826
- ISSN
- 2352-152X
2352-1538
- Abstract
- Accurate evaluation of state-of-health (SoH) and prediction of remaining useful life (RUL) are crucial to sustain the reliability of lithium-ion batteries (LIBs) via timely maintenance actions. However, ambient noises under various operating conditions hinder accurate diagnosis of dynamic status for LIBs in real-world applications. To overcome this difficulty, an allied denoising convolutional neural network (DnCNN) and convolutional neural network (CNN) model is proposed as a new framework for estimating SoH and predicting RUL of LIBs under various operating environments. In the presence of unknown ambient noises, DnCNN is applied to improve prediction accuracy of SoH to eliminate the noises using a residual learning technique. To verify denoising abilities and resulting SoH prediction performance under real-life scenarios, multi-physics feature degradation testing data collected from custom test benches are used to evaluate its performance over competitive denoising techniques. Results from the experiments under various operating environments demonstrate that the proposed allied framework results in a higher accuracy and robustness than other state-of-the-art denoising methods in estimating SoH and predicting RUL of LIBs.
- Files in This Item
-
Go to Link
- Appears in
Collections - 서울 공과대학 > 서울 산업공학과 > 1. Journal Articles
- 서울 공과대학 > 서울 기계공학부 > 1. Journal Articles

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.